500mw zener diodes semelab limited reserves the right to change test c onditions, parameter limits and package dimensions without notice. information furnished by semelab is believed to be both accurate and reliable at the time of going to press. however semelab assumes no responsibility for any errors or omissions discovered in its use. semelab encourage s customers to verify that datasheets are current before placing a n order. semelab semelab semelab semelab limited limited limited limited coventry road, lutterworth, leicestershire, le17 4 jb document number 9024 telephone +44 (0) 1455 556565 fax +44 (0) 1455 552612 issue 2 email: sales@semelab-tt.com website: http://www.semelab-tt.com page 1 of 4 1n5221bd2a to 1n5261bd2a dlcc2 hermetic ceramic package designed as a drop-in replacement for ?d-5a?/ ?a-melf? package extensive voltage selection (2.4v ? 47v) standard zener voltage tolerance of 5% regulation over a large operating current & temperat ure range space level and high-reliability screening options av ailable absolute maximum ratings (t a = 25 c unless otherwise stated) v zm reference voltage see reference table i zm continuous dc current see reference table p t total power dissipation at t a = 75 c 500mw t j junction temperature range -55 to +175 c t stg storage temperature range -65 to +175 c t sp maximum soldering pad temperature for 20s 260 c thermal properties symbol parameter max units r ja (1) thermal resistance junction to ambient 300 c/w (1) pcb = fr4 ? 0.0625 inch (1.59mm), 1 layer, 1.0-oz c u, 0.007 inch 2 (1.7mm x 2.76mm 2 ) pad size, horizontal, in still air
500mw zener diodes 1n5221bd2a to 1n5261bd2a semelab semelab semelab semelab limited limited limited limited coventry road, lutterworth, leicestershire, le17 4 jb document number 9024 telephone +44 (0) 1455 556565 fax +44 (0) 1455 552612 issue 2 email: sales@semelab-tt.com website: http://www.semelab-tt.com page 2 of 4 electrical characteristics (t a = 25 c unless otherwise stated) nominal zener voltage test current maximum zener impedance (1) maximum reverse leakage current maximum zener voltage coefficient (2) v z @ i zt i zt z zt @ i zk z zt @ i zk = 250 a i r @v r v z p/n v ma a v %/c 1n5221 2.4 20 30 1200 100 C0.085 1n5222 2.5 20 30 1250 100 C0.085 1n5223 2.7 20 30 1300 75 C0.080 1n5224 2.8 20 30 1400 75 C0.080 1n5225 3.0 20 29 1600 50 C0.075 1n5226 3.3 20 28 1600 25 C0.070 1n5227 3.6 20 24 1700 15 C0.065 1n5228 3.9 20 23 1900 10 C0.060 1n5229 4.3 20 22 2000 5.0 1.0 0.055 1n5230 4.7 20 19 1900 5.0 0.030 1n5231 5.1 20 17 1600 5.0 2.0 0.030 1n5232 5.6 20 11 1600 5.0 3.0 +0.038 1n5233 6.0 20 7.0 1600 5.0 3.5 +0.038 1n5234 6.2 20 7.0 1000 5.0 4.0 +0.045 1n5235 6.8 20 5.0 750 3.0 5.0 +0.050 1n5236 7.5 20 6.0 500 3.0 6.0 +0.058 1n5237 8.2 20 8.0 500 3.0 6.5 +0.062 1n5238 8.7 20 8.0 600 3.0 6.5 +0.065 1n5239 9.1 20 10 600 3.0 7.0 +0.068 1n5240 10 20 17 600 3.0 8.0 +0.075 1n5241 11 20 22 600 2.0 8.4 +0.076 1n5242 12 20 30 600 1.0 9.1 +0.077 1n5243 13 9.5 13 600 0.5 9.9 +0.079 1n5244 14 9.0 15 600 0.1 10 +0.082 1n5245 15 8.5 16 600 0.1 11 +0.082 1n5246 16 7.8 17 600 0.1 12 +0.083 1n5247 17 7.4 19 600 0.1 13 +0.084 1n5248 18 7.0 21 600 0.1 14 +0.085 1n5249 19 6.6 23 600 0.1 14 +0.086 1n5250 20 6.2 25 600 0.1 15 +0.086 1n5251 22 5.6 29 600 0.1 17 +0.087 1n5252 24 5.2 33 600 0.1 18 +0.088 1n5253 25 5.0 35 600 0.1 19 +0.089 1n5254 27 4.6 41 600 0.1 21 +0.090 1n5255 28 4.5 44 600 0.1 21 +0.091 1n5256 30 4.2 49 600 0.1 23 +0.091 1n5257 33 3.8 58 700 0.1 25 +0.092 1n5258 36 3.4 70 700 0.1 27 +0.093 1n5259 39 3.2 80 800 0.1 30 +0.094 1n5260 43 3.0 93 900 0.1 33 +0.095 1n5261 47 2.7 105 1000 0.1 36 +0.095 notes: 1) zener impedance is measured to ensure a s harp knee characteristic on the breakdown curve. de rived from 50hz ac voltage from ac current of 10% r ms of i zt (or i zk ) superimposed on dc i zt (or i zk ) 2) temperature coefficient test conditions: a. i zt = 7.5ma , t 1 = 25c, t 2 = 125c (1n5221 through to 1n5242) b. i zt = rated i zt , t 1 = 25c, t 2 = 125c (1n5243 through to 1n5261) dut temperature stabilised with constant current fo r v z measurement @ t 1 ,t 2 series electrical characteristics (t a = 25 c unless otherwise) symbol parameters test conditions max units v f forward voltage i f = 200ma 1.5 v
500mw zener diodes 1n5221bd2a to 1n5261bd2a semelab semelab semelab semelab limited limited limited limited coventry road, lutterworth, leicestershire, le17 4 jb document number 9024 telephone +44 (0) 1455 556565 fax +44 (0) 1455 552612 issue 2 email: sales@semelab-tt.com website: http://www.semelab-tt.com page 3 of 4 mechanical data * the additional contact provides a connection to t he lid in the application. connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the space weather link www.semelab.co.uk/dlcc2.html on the semelab web site. package variant to be specified at order. other package outlines may be available ? contact s emelab sales to enquire dlcc2 variant a (d2a) pad 1 anode pad 2 cathode dimension mm inches a 5.00 0.10 0.197 0.004 b 2.61 0.10 0.103 0.004 c 1.08 0.10 0.043 0.004 d 1.76 0.10 0.069 0.004 dlcc2 variant b (d2b) pad 1 anode pad 2 cathode pad 3 lid contact to anode* dimension mm inches a 5.00 0.10 0.197 0.004 b 2.61 0.10 0.103 0.004 c 1.08 0.10 0.043 0.004 d 1.76 0.10 0.069 0.004 a b c solder pad layout d - 5a dimension mm inches a 6.25 0.246 b 1.70 0.067 c 2.67 0.105 dlcc2/ d-5a melf overlay
500mw zener diodes 1n5221bd2a to 1n5261bd2a semelab semelab semelab semelab limited limited limited limited coventry road, lutterworth, leicestershire, le17 4 jb document number 9024 telephone +44 (0) 1455 556565 fax +44 (0) 1455 552612 issue 2 email: sales@semelab-tt.com website: http://www.semelab-tt.com page 4 of 4 screening options space level (jqrs/esa) and high reliability options a re available in accordance with the high reliability and screening options handbook available for download from the from the tt electronics semelab web site. esa quality level products are based on the testing procedures specified in the generic escc 5000 and in the corresponding part detail specifications. semelabs qr216 and qr217 processing specifications (jqrs), in conjunction with the companies iso 9001: 2000 approval present a viable alternative to the america n mil- prf-19500 space level processing. qr217 (space level quality conformance) is based on the quality conformance inspection requirements of mil- prf- 19500 groups a (table v), b (table via), c (table vi i) and also esa / escc 5000 (chart f4) lot validation tests. qr216 (space level screening) is based on the scree ning requirements of mil-prf-19500 (table iv) and also e sa /escc 5000 (chart f3). jqrs parts are processed to the device data sheet a nd screened to qr216 with conformance testing to q217 groups a and b in accordance with mil-std-750 method s and procedures. additional conformance options are available, for ex ample pre-cap visual inspection, buy-off visit or data pac ks. these are chargeable and must be specified at the o rder stage (see ordering information). minimum order quantities may apply. alternative or additional customer specific conforma nce or screening requirements would be considered. contact semelab sales with enquires. marking details parts can be laser marked with approximately 7 char acters on two lines and always includes cathode identifica tion. typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. customer specific marking requirements can be arrang ed at the time of order. example marking: ordering information part numbers are built up from type, package varian t, and screening level. the part numbers are extended to i nclude the additional options as shown below. type ? see electrical characteristics table package variant ? see mechanical data screening level ? see screening options (esa / jqrs) additional options: customer pre-cap visual inspection .cvp customer buy-off visit .cvb data pack .da solderability samples .ss scanning electron microscopy .sem radiography (x-ray) .xray total dose radiation test .rad mil-prf-19500 (qr217) group b charge .grpb group b destructive mechanical samples .gbdm (12 pi eces) group c charge .grpc group c destructive electrical samples .gcde (12 pi eces) group c destructive mechanical samples .gcdm (6 pie ces) esa/escc lot validation testing (subgroup 1) charge .lvt1 lvt1 destructive samples (environmental) .l1de (15 pieces) lvt1 destructive samples (mechanical) .l1dm (15 pie ces) lot validation testing (subgroup 2) charge .lvt2 lvt2 endurance samples (electrical) .l2d (15 pieces ) lot validation testing (subgroup 3) charge .lvt3 lvt3 destructive samples (mechanical) .l3d (5 piece s) additional option notes: 1) all ?additional options? are chargeable and must be specified at order stage. 2) when group b,c or lvt is required, additional el ectrical and mechanical destructive samples must be ordered 3) all destructive samples are marked the same as o ther production parts unless otherwise requested. example ordering information: the following example is for the 1n5245b part with package variant a, jqrs screening, additional group c conformance testing and a data pack. part numbers: 1n5245bd2a-jqrs (include quantity for flight parts) 1n5245bd2a.grpc (chargeable conformance option) 1n5245bd2a.gcde (charge for destructive parts) 1n5245bd2a.gcdm (charge for destructive parts) 1n5245bd2a.da (charge for data pack) customers with any specific requirements (e.g. marki ng or screening) may be supplied with a similar alternati ve part number (there is maximum 20 character limit to part numbers). contact semelab sales with enquiries. high reliability and screening options handbook link : http://www.semelab.co.uk/pdf/misc/documents/hirel_ and_screening_options.pdf
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